Abstract: Measurement is an important aspect for advanced lithography in sub-10 nm technology node. We developed a novel algorithmic approach for precise quantitative measurements of line width ...
Don't prioritize your tasks by what will take the most time—try choosing what will have the biggest impact. That's what the Most Important Task (MIT) method involves: rather than thinking of specific ...
Abstract: Circuit designers favor open-loop stability analysis, which finds a breaking point in phase margin (PM) simulation. However, the conventional open-loop based method may not suit a multi-loop ...
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